Utilizing Secondary Ion Mass Spectrometry (SIMS) for in-line metrology is a newly emerging method of process control that requires contamination-free measurements, enabling SIMS on product wafers.

IN a recent series of papers 1, one of us (F.L.A.) has discussed experiments, carried out with the assistance of Dr. J. C. Milligan, which led to the discovery of a new process of negative ion ...

Do you ever wonder why it feels so good to be outdoors, in the woods, on the water and especially around waterfalls? Negative ions might be the answer. Negative air ions are actually positive ...

A battery's positive end (cathode) and negative end (anode) are two vital components that largely define how well it can ...

Copper ions in solution moving between two electrodes in a magnetic field produce a swirling motion that can easily be displayed on an overhead projector. Place some pepper on the surface of the ...